A detector is typically the first stage of a communication
system. Noise in this stage may have significant effects on the operation
of the entire system. In this chapter we will use detector and sensor interchangeably.
A detector or sensor senses a physical parameter of some
kind. In the field of optics and infrared the term detector is typically
used.
To develop the noise model of a sensor, we can start with
its circuit diagram. From this we draw an ac equivalent circuit that includes
all impedances and generators. To each resistance and current generator
we add the appropriate thermal noise an excess noise. The current generators
may have shot noise, 1/f noise and burst noise. Using this equivalent circuit
an expression for gain and equivalent input noise can be derived.
A typical sensor/detector electronic system includes a coupling device or
network as well as an amplifier. The noise equivalent circuit of the coupling
network is easily obtained, and the En-In representation
is valid for the amplifier. When we combine these three parts, we obtain a
equivalent for the system.
The derivation of the equivalent input noise for the system follows 3 steps:
Determine the total output noise.
Calculate the system gain.
Divide the total output noise by the system gain to obtain the equivalent
input noise.
General Noise Model
For Detector System
In the diagram shown the sensor is described by its signal voltage Vs
, its internal impedance Zs, and a noise generator Es
which represents all sources of sensor noise. To generalize the diagram a
coupling network represented by impedance Zc and an noise source
Ec is included in shunt with the input. We want to combine and
reflect all noise sources to the input as shown in Fig.
5-1(b) and (c).
A general form for the equivalent input noise voltage is
Alternatively
where
If the signal source is a current generator, the equivalent noise current
expression is more convenient. If the signal is a voltage generator, the equivalent
is more convenient.
Effect of
Parallel Load Resistance
The simplest type of sensor is represented by a resistance in series with
a signal voltage generator as shown in Fig. 5-2
Also shown is a shunt network consisting of Rp and noise generator
Ep. One practical purpose of the circuit may be to supply the sensor
with bias power. The signal Vs and noise Es of the sensor
are in series with the source resistance. The input signal-to-noise power
ratio is simply the ratio of Vs2 to Es2.
When a load resistor such as Rp or other coupling network elements
are added, the output signal-to-noise ratio is degraded.
Example: Determine the output signal-to-noise ratio when Rp=Rs
Since Es=Ep it follows that
The output signal is Therefore,
the output SNR is
We conclude that a shunt resistor decreases the signal more than the noise
and the result is a decrease in the SNR. For the matched condition, source
resistance equal to the load resistance the SNR is reduced by 50%.
Here a noisy shunt resistance is present. For convenience we represent its
noise by a current generator .
Amplifier noise En and In are added. We calculate the
equivalent noise following the steps below:
From the equivalent circuit determine the output noise Eno
Calculate the system gain Kt the transfer function from sensor to output
Divide the output noise by the system gain to obtain the equivalent input
noise
Effect of Shunt
Capacitance
Although capacitance is virtually noise free, it can increase the equivalent
input noise. A shunt capacitance does not affect the sensor SNR because it
decreases the sensor signal and noise equally, but not the following amplifier
noise. Consider the equivalent circuit shown and using the method outlined
above the output noise is
As a first example we consider the case of a resistive sensor that generates
a voltage signal. These detectors include the thermocouple, pyroelectric infrared
cell, generators, and other primarily detectors that are resistive in nature
that generate a voltage signal.
The sensor is represented by the signal source Vs and the internal series
resistance Rs. The voltage Vs is the output from the sensed physical or electrical
parameter such as pressure or radiation. A coupling capacitor Cc can be used
if we are interested exclusively in the time-varying output of the sensor.
The element RL may be needed for impedance matching. The noise model of the
sensor-amplifier system is shown in Fig. 8-2. The shunt capacitance Cp can
be in the sensor assembly or it may represent the parasitic stray capacitance
between lead wires. The amplifier is now represented by the noise parameters
En and In.
For low noise, the noise contribution of RL is kept low if it is large.
The shunt capacitance should be minimized to avoid increasing En at high frequencies.
The decoupling capacitor Cc should be very large or removed to reduce its
effect on the amplifierˇ¦s In noise at low-frequencies. The amplifier
input resistance Ri can often be reduced with overall negative feedback to
increase the corner frequency caused by Cp
Optoelectronic Detector
An optoelectronic detector is used to detect various forms of visible and
nonvisible radiation and has a wide range of applications such as infrared
detection, heat measurement, light and color measurement, fiber optic detectors,
sensors for compact disk players, laser detectors and many other uses.
There are 2 general types of solid-state photon detectors: photoconductive
and photovoltaic.
In a photoconductive detector, radiation on a cell produced a current in
addition to the dark current. Bias is applied to the cell to collect the current.
In a photovoltaic detector, radiation on the cell produces a voltage directly.
Photoconductive cells can be fabricated from bulk semiconductor material where
the conductivity increases as radiant energy is absorbed.
The simplified circuit diagram is shown in Fig. 5-7
The reverse bias is supplied by VBB, which collects the current
generated by the radiant photon signal. A voltage signal is developed across
the load or bias resistor RB.
Most often photodiodes are used with op amps employing negative feedback
to produce the photoconductive detector as shown in Fig.
5-8
The feedback resistor RB produces a virtual ground at the anode
of the photodiode which reduces the input impedance, and thereby increasing
the frequency response. The output voltage is V0=-IDRB
where ID is the reverse bias current in the photodiode. Ideally,
R2=RB to reduce the output
offset voltage caused by the input bias current. However, R2
adds noise as can be seen from the noise equivalent circuit below: The load
resistor RB has the same effect on equivalent input noise and gain
for either circuit. The noise equivalent circuit of the photodiode detector
is shown in Fig.8-7. The signal current source Is is located at
the input and :
rd = noiseless dynamic reverse-bias resistance of the photodiode
RB = feedback resistance
Rcell = cell series resistance (< 50W)
R2 = bias resistor for noninverting input
Ecell = thermal noise of Rcell
En = amplifier noise voltage
Cd = cell capacitance
CW = stray wiring capacitance
ID = sensor dc photocurrent plus dark current
InB = (4kT/RB)1/2 = thermal noise of RB
Ip = (Ish2 +IG-R2
+I1/f2)1/2
In1 = amplifier noise current for inverting input
In2 = amplifier noise current for noninverting input
The cell capacitance Cd and wiring capacitance CW probably will be the frequency-limiting
elements so they should be kept as small as possible. The input capacitance,
Ci, and input resistance, Ri, drop out of the noise expression, they do affect
the amplifier gain. This gives us a mechanism for optimizing the frequency
and noise responses separately.